DFT EngineerLNT/DE/1553239
LTST-L&T Semiconductor Technologies LimitedBengaluru
Posted On
29 Dec 2025
End Date
27 Jun 2026
Required Experience
1 - 3 Years
Skills
Knowledge & Posting Location
DFT
VLSI DESIGN FOR TESTABILITY - DFT
SCAN INSERTION
ATPG - VLSI AUTOMATIC TEST PATTERN GENERATION
Minimum Qualification
BACHELOR OF ELECTRICAL ENGINEERING (BEE)
Purpose of the Role:
The Design for Testability (DFT) engineering organization at L&T Semiconductor Technologies (LTSCT) pioneers innovative methods and technologies in the areas of DFT architecture, verification, and post-silicon bring-up of state-of-the-art semiconductor chips, such as System on a Chip (SoCs), developed using the latest semiconductor technology nodes.
Areas of Responsibilities:
Implement various DFT techniques, including:
Memory Built-In Self-Test (MBIST) insertion.
Compressor-based scan chain insertion.
Boundary Scan (BSCAN) structure insertion compliant with IEEE 1149.1 and 1149.6 standards.
Logic Built-In Self-Test (BIST) for self-test capability.
Analog BIST implementation for selected analog blocks, such as PLLs, ADCs, and DACs.
IO Built-In Self-Test (IOBist) methods for IO structures of SoCs.
Conduct DFT simulations and analyze results to ensure comprehensive test coverage and high quality.
Debug and resolve DFT-related issues throughout the design process.
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